Examples

Monitor strain development at interfaces

Detected transition corresponds to a change in deposition source within the heterostructure

---

Develop proxies for ex-situ characterization

Predict properties based on correlations between quantified RHEED patterns and ex-situ characterization

Example: doping concentration from XPS

Intensity maxima position observed to correlates with doping

---

Engineering film surfaces

Automatically detected changes in RHEED videos can be used to understand the relationship between process controls and surface characteristics. Source shuttering or various annealing steps can be correlated with metrics extracted from RHEED pattern features to develop better control over surface termination.

There are a number of examples in the literature demonstrate using the foundational clustering techniques employed in AtomCloud to engineering surfaces.